diff --git a/src/app/tests/TestEventLogging.cpp b/src/app/tests/TestEventLogging.cpp index a700475aa91f29..8ae17133e924bd 100644 --- a/src/app/tests/TestEventLogging.cpp +++ b/src/app/tests/TestEventLogging.cpp @@ -36,6 +36,7 @@ #include #include #include +#include #include #include #include @@ -148,13 +149,16 @@ static void CheckLogReadOut(nlTestSuite * apSuite, chip::app::EventManagement & chip::TLV::TLVReader reader; chip::TLV::TLVWriter writer; size_t eventCount = 0; - uint8_t backingStore[1024]; + + chip::Platform::ScopedMemoryBuffer backingStore; + VerifyOrDie(backingStore.Alloc(1024)); + size_t totalNumElements; - writer.Init(backingStore, 1024); + writer.Init(backingStore.Get(), 1024); err = alogMgmt.FetchEventsSince(writer, clusterInfo, startingEventNumber, eventCount, chip::Access::SubjectDescriptor{}); NL_TEST_ASSERT(apSuite, err == CHIP_NO_ERROR || err == CHIP_END_OF_TLV); - reader.Init(backingStore, writer.GetLengthWritten()); + reader.Init(backingStore.Get(), writer.GetLengthWritten()); err = chip::TLV::Utilities::Count(reader, totalNumElements, false); NL_TEST_ASSERT(apSuite, err == CHIP_NO_ERROR); @@ -162,7 +166,7 @@ static void CheckLogReadOut(nlTestSuite * apSuite, chip::app::EventManagement & printf("totalNumElements vs expectedNumEvents vs eventCount : %u vs %u vs %u \n", static_cast(totalNumElements), static_cast(expectedNumEvents), static_cast(eventCount)); NL_TEST_ASSERT(apSuite, totalNumElements == expectedNumEvents && totalNumElements == eventCount); - reader.Init(backingStore, writer.GetLengthWritten()); + reader.Init(backingStore.Get(), writer.GetLengthWritten()); chip::TLV::Debug::Dump(reader, SimpleDumpWriter); } @@ -328,7 +332,7 @@ nlTestSuite sSuite = int TestEventLogging() { - TestContext gContext; + static TestContext gContext; nlTestRunner(&sSuite, &gContext); return (nlTestRunnerStats(&sSuite)); }