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FN Thomson Reuters Web of Science™
VR 1.0
PT J
AU BREVIK, I
AF BREVIK, I
TI EXPERIMENTS IN PHENOMENOLOGICAL ELECTRODYNAMICS AND THE ELECTROMAGNETIC
ENERGY-MOMENTUM TENSOR
SO PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS
LA English
DT Review
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PU ELSEVIER SCIENCE BV
PI AMSTERDAM
PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
SN 0370-1573
J9 PHYS REP
JI Phys. Rep.-Rev. Sec. Phys. Lett.
PY 1979
VL 52
IS 3
BP 133
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DI 10.1016/0370-1573(79)90074-7
PG 69
WC Physics, Multidisciplinary
SC Physics
GA GV556
UT WOS:A1979GV55600001
ER
PT J
AU COWAN, JJ
ANICIN, B
AF COWAN, JJ
ANICIN, B
TI LONGITUDINAL AND TRANSVERSE DISPLACEMENTS OF A BOUNDED MICROWAVE BEAM AT
TOTAL INTERNAL-REFLECTION
SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA
LA English
DT Article
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PA CIRCULATION FULFILLMENT DIV, 500 SUNNYSIDE BLVD, WOODBURY, NY 11797-2999
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PY 1977
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WC Physics, Multidisciplinary
SC Physics
GA DW703
UT WOS:A1977DW70300003
ER
PT J
AU Nasalski, W
AF Nasalski, W
TI Longitudinal and transverse effects of nonspecular reflection
SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND
VISION
LA English
DT Article
ID TOTAL-INTERNAL-REFLECTION; INHOMOGENEOUS WAVE TYPES; GOOS-HANCHEN SHIFT;
DIELECTRIC INTERFACE; BEAM DISPLACEMENT; GAUSSIAN BEAMS; LATERAL
DISPLACEMENT; PLANAR INTERFACES; COMPLEX RAYS; LIGHT BEAM
AB A rigorous spectral analysis is given for the nonspecular reflection of a three-dimensional Gaussian beam at a dielectric isotropic planar structure. For the first time all independent nonspecular effects are derived in a self-consistent manner for the three-dimensional case. It is shown that the longitudinal nonspecular effects in the incidence plane, that is, the lateral and focal shifts of the beam waist position, the angular rotation of the reflected-beam axis, and the modifications of the beam waist width and complex amplitude, have their direct analogies in the plane transverse to the incidence and interface planes that gives transverse nonspecular effects. Moreover, the existence of the other, not yet reported, effect of nonspecular modification of the beam polarization is also proved. A role for TM and TE polarizations in reflected-beam formation is indicated. The results show that, up to the symmetric second-order terms in approximation of Fresnel coefficients, each of the longitudinal and transverse beam factors independently preserves its shape under reflection at the expense of changes of the beam reference frame, width, amplitude, and polarization parameters. (C) 1996 Optical Society of America
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NR 64
TC 71
Z9 71
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036
SN 0740-3232
J9 J OPT SOC AM A
JI J. Opt. Soc. Am. A-Opt. Image Sci. Vis.
PD JAN
PY 1996
VL 13
IS 1
BP 172
EP 181
DI 10.1364/JOSAA.13.000172
PG 10
WC Optics
SC Optics
GA TN217
UT WOS:A1996TN21700022
ER
PT J
AU Pillon, F
Gilles, H
Girard, S
AF Pillon, F
Gilles, H
Girard, S
TI Experimental observation of the Imbert-Fedorov transverse displacement
after a single total reflection
SO APPLIED OPTICS
LA English
DT Article
ID BEAM
AB We describe a simple experimental setup with which to observe the transverse shift-also known as the Imbert-Fedorov effect-that circularly or elliptically polarized optical beams undergo after a single total internal reflection on a dielectric plane. A comparison between a theoretical model based on the conservation of energy and experimental measurements shows good agreement simultaneously for longitudinal (Goos-Hanchen) and transverse (Imbert-Fedorov) displacements. (C) 2004 Optical Society of America.
C1 Ecole Natl Super Ingn Caen, Equipe Capteur & Instrumentat Opt, Ctr Interdisciplinaire Rech Ions Lasers, CEA,CNRS, F-14050 Caen, France.
RP Pillon, F (reprint author), Ecole Natl Super Ingn Caen, Equipe Capteur & Instrumentat Opt, Ctr Interdisciplinaire Rech Ions Lasers, CEA,CNRS, 6 Blvd Marchal Juin, F-14050 Caen, France.
EM sylvain.girard@ismra.fr
CR ARTMANN K, 1948, ANN PHYS-BERLIN, V2, P87
Born M., 1999, PRINCIPLES OPTICS
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Costa de Beauregard O., 1977, Physical Review D (Particles and Fields), V15
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GOOS F, 1949, ANN PHYS-LEIPZIG, V2, P87
GOOS F, 1947, ANN PHYS-BERLIN, V1, P333
Imbert C., 1972, Nouvelle Revue d'Optique Appliquee, V3, DOI 10.1088/0029-4780/3/4/304
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NR 13
TC 47
Z9 48
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
SN 1559-128X
EI 2155-3165
J9 APPL OPTICS
JI Appl. Optics
PD MAR 20
PY 2004
VL 43
IS 9
BP 1863
EP 1869
DI 10.1364/AO.43.001863
PG 7
WC Optics
SC Optics
GA 805JK
UT WOS:000220362400013
PM 15072036
ER
PT J
AU Gilles, H
Girard, S
Hamel, J
AF Gilles, H
Girard, S
Hamel, J
TI Simple technique for measuring the Goos-Hanchen effect with polarization
modulation and a position-sensitive detector
SO OPTICS LETTERS
LA English
DT Article
ID REFLECTION
AB An original approach to directly measuring the Goos-Hanchen longitudinal shift between TE and TM polarization states during a total internal reflection is introduced. The technique is based on the modulation of the polarization state of a laser by an electro-optic modulator combined with a precise measurement of the resulting spatial displacement with a position-sensitive detector. This method presents many advantages over other techniques and allows measurements at different wavelengths over a broad range for the incident angle. (C) 2002 Optical Society of America.
C1 Ctr Interdisciplinaire Rech Ions Lasers, Equipe Phys Atom & Canteurs, F-14050 Caen, France.
RP Gilles, H (reprint author), Ctr Interdisciplinaire Rech Ions Lasers, Equipe Phys Atom & Canteurs, 6 Blvd Marechal Juin, F-14050 Caen, France.
CR ARTMANN K, 1948, ANN PHYS-BERLIN, V2, P87
BRETENAKER F, 1992, PHYS REV LETT, V68, P931, DOI 10.1103/PhysRevLett.68.931
CHERON B, 1999, B UNION PHYSICIENS F, V93, P37
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Gilles H, 2001, OPT COMMUN, V190, P179, DOI 10.1016/S0030-4018(01)01070-7
GOOS F, 1949, ANN PHYS-LEIPZIG, V2, P87
GOOS F, 1947, ANN PHYS-BERLIN, V1, P333
HUGONIN JP, 1977, J OPT, V8, P73, DOI 10.1088/0150-536X/8/2/001
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RENARD RH, 1964, J OPT SOC AM, V54, P1190, DOI 10.1364/JOSA.54.001190
1999, OPTICAL COMPONENTS G
NR 12
TC 40
Z9 43
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
SN 0146-9592
J9 OPT LETT
JI Opt. Lett.
PD AUG 15
PY 2002
VL 27
IS 16
BP 1421
EP 1423
DI 10.1364/OL.27.001421
PG 3
WC Optics
SC Optics
GA 584TF
UT WOS:000177484300017
PM 18026466
ER
PT J
AU Pillon, F
Gilles, H
Girard, S
Laroche, M
Kaiser, R
Gazibegovic, A
AF Pillon, F
Gilles, H
Girard, S
Laroche, M
Kaiser, R
Gazibegovic, A
TI Goos-Hanchen and Imbert-Fedorov shifts for leaky guided modes
SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
LA English
DT Article
ID TOTAL-REFLECTION
AB The Goos-Hanchen shift for a light beam totally reflected on the external interface of a dielectric thin film deposited on a high-index substrate can be strongly enhanced through some specific incidence angles corresponding to the leaky guided modes into the layer. Because the resonant eigenstates are polarization dependent, it has been possible to observe such resonance with an experimental setup based on a periodic modulation of the polarization state combined with position-sensitive detection. Classical models usually used for a single interface (Artmann's model based on phase argument and Renard's model based on an energetic interpretation) have been re-adapted to describe the behavior of the entire layer. Good agreement is obtained between theory and experimental results. (C) 2005 Optical Society of America.
C1 Ecole Natl Super Ingn Caen, Ctr Interdisciplinaire Rech Ions Laser, CNRS, Commiss Energie Atom,UMR 6637, F-14050 Caen, France.
CNRS, Inst Nonlinear Nice, UMR 6618, F-06560 Valbonne, France.
Prirodno Matemat Fak, Sarajevo, Bosnia & Herceg.
RP Girard, S (reprint author), Ecole Natl Super Ingn Caen, Ctr Interdisciplinaire Rech Ions Laser, CNRS, Commiss Energie Atom,UMR 6637, 6 Blvd Marechal Juin, F-14050 Caen, France.
EM sylvain.girard@ensicaen.fr
RI kaiser, robin/J-3641-2014
OI kaiser, robin/0000-0001-5194-3680
CR ARTMANN K, 1948, ANN PHYS-BERLIN, V2, P87
Berman PR, 2002, PHYS REV E, V66, DOI 10.1103/PhysRevE.66.067603
Born M., 1999, PRINCIPLES OPTICS
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FEDOROV FI, 1955, DOKL AKAD NAUK SSSR+, V105, P465
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GOOS F, 1947, ANN PHYS-BERLIN, V1, P333
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Shadrivov IV, 2003, APPL PHYS LETT, V83, P2713, DOI 10.1063/1.1615678
NR 16
TC 37
Z9 39
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
SN 0740-3224
J9 J OPT SOC AM B
JI J. Opt. Soc. Am. B-Opt. Phys.
PD JUN
PY 2005
VL 22
IS 6
BP 1290
EP 1299
DI 10.1364/JOSAB.22.001290
PG 10
WC Optics
SC Optics
GA 934GB
UT WOS:000229693800018
ER
PT J
AU Flory, F
Escoubas, L
AF Flory, F
Escoubas, L
TI Optical properties of nanostructured thin films
SO PROGRESS IN QUANTUM ELECTRONICS
LA English
DT Review
DE optical properties; thin films; nanostructure; dielectric; water
adsorption
ID ION-ASSISTED DEPOSITION; GUIDED-WAVE TECHNIQUE; REFRACTIVE-INDEX;
COLUMNAR MICROSTRUCTURE; ANISOTROPY; FILTERS; TEMPERATURE; COUPLER;
LAYERS
AB Because of their spontaneous nanostructure thin films behave differently from bulk materials of equivalent chemical composition. Depending both on material and deposition technique, optical thin films present structures, which when observed with an electronic microscope, may appear as columnar, polycrystalline, amorphous or lacunar. However, as these structures are in a nanometric scale they do not scatter light whereas they change the mean refractive index of the material. The lacunar structure also leads to water adsorption which induces shifts in the spectral properties of multilayer filters. A review of the work in this field is presented. Thanks to the progress in photolithography techniques, materials can now be artificially nano structured, and the mean refractive index can be controlled in this way. Thin films nano-structured in one dimension are anisotropic. A comparison between measured anisotropy and calculated anisotropy using homogenization models is given. Ion implantation is also shown to be a useful means of locally changing the refractive index and to control the mean refractive index. Calculation of polarizing multilayer filters made with such anisotropic layers is presented. (C) 2003 Elsevier Ltd. All rights reserved.
C1 CNRS, UMR 6133, Inst Fesnel, Ecole Natl Super Phys Marseille, F-13397 Marseille 20, France.
RP Flory, F (reprint author), CNRS, UMR 6133, Inst Fesnel, Ecole Natl Super Phys Marseille, Domaine Univ St Jerome, F-13397 Marseille 20, France.
EM francis.flory@fresnel.fr
RI Wu, Qihong/B-9803-2009; Escoubas, Ludovic/E-9703-2012
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NR 58
TC 32
Z9 32
PU PERGAMON-ELSEVIER SCIENCE LTD
PI OXFORD
PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND
SN 0079-6727
J9 PROG QUANT ELECTRON
JI Prog. Quantum Electron.
PY 2004
VL 28
IS 2
BP 89
EP 112
DI 10.1016/j.pquantelec.2003.09.002
PG 24
WC Engineering, Electrical & Electronic
SC Engineering
GA 800ZF
UT WOS:000220065500002
ER
PT J
AU HUGONIN, JP
PETIT, R
AF HUGONIN, JP
PETIT, R
TI GENERAL STUDY OF DISPLACEMENTS AT TOTAL REFLECTION
SO JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE
LA French
DT Article
C1 UNIV PARIS 11,INST OPTIQUE,F-91405 ORSAY,FRANCE.
FAC SCI & TECH ST JEROME,OPTIQUE ELECTROMAGNET,F-13397 MARSEILLE 4,FRANCE.
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NR 22
TC 32
Z9 33
PU IOP PUBLISHING LTD
PI BRISTOL
PA DIRAC HOUSE, TEMPLE BACK, BRISTOL, ENGLAND BS1 6BE
SN 0150-536X
J9 J OPT
JI J. Opt.-Nouv. Rev. Opt.
PY 1977
VL 8
IS 2
BP 73
EP 87
DI 10.1088/0150-536X/8/2/001
PG 15
WC Optics
SC Optics
GA CZ594
UT WOS:A1977CZ59400001
ER
PT J
AU BIRMAN, JL
PATTANAYAK, DN
PURI, A
AF BIRMAN, JL
PATTANAYAK, DN
PURI, A
TI PREDICTION OF A RESONANCE-ENHANCED LASER-BEAM DISPLACEMENT AT TOTAL
INTERNAL-REFLECTION IN SEMICONDUCTORS
SO PHYSICAL REVIEW LETTERS
LA English
DT Article
RP BIRMAN, JL (reprint author), CUNY CITY COLL,DEPT PHYS,NEW YORK,NY 10031, USA.
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NR 15
TC 30
Z9 31
PU AMERICAN PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 0031-9007
J9 PHYS REV LETT
JI Phys. Rev. Lett.
PY 1983
VL 50
IS 21
BP 1664
EP 1667
DI 10.1103/PhysRevLett.50.1664
PG 4
WC Physics, Multidisciplinary
SC Physics
GA QQ825
UT WOS:A1983QQ82500009
ER
PT J
AU Baida, FI
Van Labeke, D
Vigoureux, JM
AF Baida, FI
Van Labeke, D
Vigoureux, JM
TI Numerical study of the displacement of a three-dimensional Gaussian beam
transmitted at total internal reflection. Near-field applications
SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND
VISION
LA English
DT Article
ID TUNNELING OPTICAL MICROSCOPY; DIELECTRIC INTERFACE; SURFACE-PLASMONS;
NONSPECULAR REFLECTION; LIGHT BEAM; EXCITATION; MEDIA; SHIFT; LAW
AB Longitudinal and transverse shifts of a light beam at total internal reflection was experimentally studied by far-field measurements on the reflected field. We propose to use a scanning tunneling optical microscope (STOM) to study these shifts in transmission, and we present a theoretical model of this proposed experiment to obtain a numerical estimation of these shifts. We study the reflection and the transmission of a three-dimensional polarized incident beam. We verify the validity of our formalism by studying the Goos-Hanchen shift in reflection and by comparing our results with published ones. Then we calculate STOM images of the transmitted field distribution. On the images the well-known Goos-Hanchen shift is easily observed. But we also encounter a smaller shift, perpendicular to the plane of incidence. This transverse shift was also observed in reflection by Imbert and Levy [Nouv. Rev. Opt. 6, 285 (1975)]. We study the variations of the two shifts versus various parameters such as the angle of incidence, the optical index, and the incident polarization. Then we discuss the feasibility of the near-field observation of these shifts. (C) 2000 Optical Society of America [S0740-3232(00)01604-5].
C1 Univ Franche Comte, Inst Microtech Franche Comte, CNRS UMR 6603, Lab Opt PM Duffieux, F-25030 Besancon, France.
Univ Franche Comte, Phys Mol Lab, CNRS, UMR 6624, F-25030 Besancon, France.
RP Baida, FI (reprint author), Univ Franche Comte, Inst Microtech Franche Comte, CNRS UMR 6603, Lab Opt PM Duffieux, FR 0067, F-25030 Besancon, France.
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NR 48
TC 24
Z9 24
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
SN 0740-3232
J9 J OPT SOC AM A
JI J. Opt. Soc. Am. A-Opt. Image Sci. Vis.
PD MAY
PY 2000
VL 17
IS 5
BP 858
EP 866
PG 9
WC Optics
SC Optics
GA 309JJ
UT WOS:000086764500005
ER
PT J
AU RIGNEAULT, H
FLORY, F
MONNERET, S
AF RIGNEAULT, H
FLORY, F
MONNERET, S
TI NONLINEAR TOTALLY REFLECTING PRISM COUPLER - THERMOMECHANIC EFFECTS AND
INTENSITY-DEPENDENT REFRACTIVE-INDEX OF THIN-FILMS
SO APPLIED OPTICS
LA English
DT Article
DE INTENSITY-DEPENDENT REFRACTIVE INDEX; THERMAL EFFECT; PRISM COUPLER;
DIELECTRIC THIN FILMS; GUIDED WAVES
ID OPTICAL BISTABILITY; PULSED EXCITATION; PLANAR RESONATORS; GUIDES; WAVE
AB Starting with an accurate linear electromagnetic theory of a totally reflecting prism coupled to a dielectric waveguide, we implement a numerical technique to take into account optogeometric perturbations in stratified media. We calculate both the reflected fields in intensity on the prism base (near field) and in infinity (far field) for an incident Gaussian beam. The study of the variations of the intensity in the reflected beam (near and far fields) versus light power shows thermoinduced dilation of the prism and an intensity-dependent refractive index of thin films composed of tantalium pentoxyde and titanium dioxide.
RP RIGNEAULT, H (reprint author), DOMAINE UNIV ST JEROME,ECOLE NATL SUPER PHYS MARSEILLE,CNRS,OPT SURFACES & COUCHES MINCES LAB,F-13397 MARSEILLE 20,FRANCE.
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NR 23
TC 19
Z9 19
PU OPTICAL SOC AMER
PI WASHINGTON
PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036
SN 0003-6935
J9 APPL OPTICS
JI Appl. Optics
PD JUL 20
PY 1995
VL 34
IS 21
BP 4358
EP 4369
PG 12
WC Optics
SC Optics
GA RL129
UT WOS:A1995RL12900028
PM 21052270
ER
PT J
AU TURNER, RG
AF TURNER, RG
TI SHIFTS OF COHERENT-LIGHT BEAMS ON REFLECTION AT PLANE INTERFACES BETWEEN
ISOTROPIC MEDIA
SO AUSTRALIAN JOURNAL OF PHYSICS
LA English
DT Article
RP TURNER, RG (reprint author), MONASH UNIV,DEPT PHYS,CLAYTON,VIC 3168,AUSTRALIA.
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NR 42
TC 11
Z9 11
PU C S I R O PUBLICATIONS
PI COLLINGWOOD
PA 150 OXFORD ST, PO BOX 1139, COLLINGWOOD VICTORIA 3066, AUSTRALIA
SN 0004-9506
J9 AUST J PHYS
JI Aust. J. Phys.
PY 1980
VL 33
IS 2
BP 319
EP 335
PG 17
WC Physics, Multidisciplinary
SC Physics
GA KF803
UT WOS:A1980KF80300015
ER
PT J
AU PURI, A
PATTANAYAK, DN
BIRMAN, JL
AF PURI, A
PATTANAYAK, DN
BIRMAN, JL
TI RESONANCE EFFECTS ON TOTAL INTERNAL-REFLECTION AND LATERAL
(GOOS-HANCHEN) BEAM DISPLACEMENT AT THE INTERFACE BETWEEN NONLOCAL AND
LOCAL DIELECTRIC
SO PHYSICAL REVIEW B
LA English
DT Article
C1 KYOTO UNIV,FUNDAMENTAL PHYS RES INST,KYOTO 606,JAPAN.
RP PURI, A (reprint author), CUNY CITY COLL,DEPT PHYS,NEW YORK,NY 10031, USA.
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NR 42
TC 10
Z9 11
PU AMERICAN PHYSICAL SOC
PI COLLEGE PK
PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
SN 0163-1829
J9 PHYS REV B
JI Phys. Rev. B
PY 1983
VL 28
IS 10
BP 5877
EP 5886
DI 10.1103/PhysRevB.28.5877
PG 10
WC Physics, Condensed Matter
SC Physics
GA RR590
UT WOS:A1983RR59000051
ER
PT J
AU Pillon, F
Gilles, H
Girard, S
Laroche, M
Emile, O
AF Pillon, F
Gilles, H
Girard, S
Laroche, M
Emile, O
TI Transverse displacement at total reflection near the grazing angle: a
way to discriminate between theories
SO APPLIED PHYSICS B-LASERS AND OPTICS
LA English
DT Article