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JER Corrections #202
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There's a nanoAOD-tools module for that (link). |
It's not applied in production, it would be very nice to have it. For those cases, we should rather use a semi-deterministic approach as it is done for the EGM smearings (see EgammaAnalysis/ElectronTools/plugins/CalibratedElectronProducersRun2.cc). Would you please try implementing that in a producer? |
@zdemirag @ahinzmann would you agree? |
A semi-deterministic approach is certainly better. |
I also agree that to some level a deterministic approach is good way to go. In the this PR: cms-sw#20240 an option was added to the templates class to achieve the deterministic JER application. @eioannou: specifically this might be useful for the smeared MET and @rappoccio was part of this conversation in the past for the PR. |
This topic is discussed in the context of the correction-lib to be added post-nano. I close this topic as nano-content will not be modified. |
Is the recommended smearing procedure [1] for jet energy resolution applied to the
Jet
collection in nanoAOD or should this be applied on-the-fly to this collection?[1] https://twiki.cern.ch/twiki/bin/view/CMS/JetResolution#Smearing_procedures
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